The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.1 X-ray technologies

[15a-4E-1~7] 7.1 X-ray technologies

Tue. Sep 15, 2015 10:00 AM - 11:45 AM 4E (437)

座長:東口 武史(宇都宮大)

10:45 AM - 11:00 AM

[15a-4E-4] The new X-ray two-dimensional detector that has the ability of discrimination of
sub-micron ~ nano size (Part 1)

〇Hiroyoshi Soejima1, Toshiyuki Kakihara2, Toshiharu Ai2, Kuniyoshi Mori2, Hiroyuki Watanabe2 (1.Applied Science Lab., 2.Hamamatsu Photonics)

Keywords:X-ray detector,Two-dimensional detector

To consider the spatial distribution of X-rays generated from the very small site and to consider how X-ray image is formed, we have developed a X-ray two-dimensional detector with a new idea. The calculation software between two-dimensional detector and the pixel can photon counting for each pixel, it is possible to visualize and quantitative identification of 10nm size.