The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.1 X-ray technologies

[15a-4E-1~7] 7.1 X-ray technologies

Tue. Sep 15, 2015 10:00 AM - 11:45 AM 4E (437)

座長:東口 武史(宇都宮大)

11:00 AM - 11:15 AM

[15a-4E-5] The New X-ray two-dimensional detector that has the ability of discrimination of
sub-micron ~ nano size (Part 2)

〇Hiroyoshi Soejima1, Toshiyuki Kakihara2, Toshiharu Ai2, Kuniyoshi Mori2, Hiroyuki Watanabe2 (1.Applied Science Lab., 2.Hamamatsu Photonics)

Keywords:X-ray detector,Two-dimensional detector

It developed a nano variable slit. The 5 nm step.is variable with the 2 nm precision. Using this slit, it verified at the slit size of the micron - the nano area.