[15p-1B-1~18] 21.1 Joint Session K

△ [15p-1B-12] A study of oxide TFT’s degradation phenomena due to self-heating under pulse voltage

〇Kahori Kise¹, Mami Fujii¹, Haruka Yamazaki¹, Satoshi Urakawa¹, Shigekazu Tomai², Koki Yano², Dapeng Wang³, Mamoru Furuta³, Yasuaki Ishikawa¹, Yukiharu Uraoka¹ (1.NAIST, 2.Idemitsu Kosan Co., Ltd., 3.Kochi Univ. of Technology)

Keywords:Oxide semiconductor,Thin film transistor,Thermal analysis