[15p-2H-1~6] Recent Trend of Analysis Techniques for Functional Materials and Devices

[15p-2H-5] Characterization of Carbon Materials using Raman Scattering Spectroscopy and Atomic Force Microscopy

〇Masamichi Yoshimura¹, Ryo Uehara¹, Seiya Suzuki¹ (1.Toyota Tech. Inst.)

Keywords:tip-enhanced Raman scattering,TERS,carbon

Present status of the characterization of carbon materials using Raman scattering spectroscopy combined with atomic force microscopy is introduced.