[15p-2R-1~22] 13.2 Exploratory Materials, Physical Properties, Devices

[15p-2R-15] Measurement of valence-band offset at native oxide/BaSi₂ interfaces using hard x-ray photoelectron spectroscopy

〇Ryota Takabe¹, Keita Ito^1,2,3, Weijie Du¹, Kaoru Toko¹, Shigenori Ueda⁴, Akio Kimura⁵, Takashi Suemasu^1,6 (1.Univ. Tsukuba, 2.JSPS, 3.Tohoku Univ., 4.SPring-8/NIMS, 5.Hiroshima Univ., 6.JST-CREST)

Keywords:semiconductor,solar cell,HAXPES