The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

13 Semiconductors » 13.8 Compound and power electron devices and process technology

[16a-4C-1~11] 13.8 Compound and power electron devices and process technology

Wed. Sep 16, 2015 9:00 AM - 12:00 PM 4C (432)

座長:東脇 正高(NICT)

10:15 AM - 10:30 AM

[16a-4C-6] 4.7 kV breakdown voltage GaN p-n diodes fabricated on free-standing GaN substrates

Hiroshi Ohta1, Naoki Kaneda2, Fumimasa Horikiri3, Yoshimobu Narita3, Takehiro Yoshida3, 〇Tomoyoshi Mishima1, Tohru Nakamura1 (1.Hoesi Univ., 2.Quantum Spread, 3.Sciocs)

Keywords:GaN,diode,high breakdown voltage

Increased breakdown voltages in vertical GaN p-n diodes fabricated on free-standing GaN substrates are discussed. By applying multiple lightly Si doped n-GaN drift layers to the p-n diode, record breakdown voltages of 4.7 kV combined with low specific differential on-resistance of 2.2 mohm-cm2 were achieved.