Depth profile characteristic evaluation technique of electron in GaN films by infrared reflection spectra

Presentation information

Oral presentation

15 Crystal Engineering » 15.4 III-V-group nitride crystals

Wed. Sep 16, 2015 1:15 PM - 5:00 PM 1D (141+142)

座長:山田陽一(山口大),上山智(名城大)

3:30 PM - 3:45 PM

〇Takaaki Kamijoh¹, Bei Ma¹, Ken Morita¹, Yoshihiro Ishitani¹ (1.Chiba Univ.)

Keywords:Infrared reflection spectra,Gallium nitride