The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[16p-2D-1~14] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

Wed. Sep 16, 2015 1:15 PM - 5:00 PM 2D (212-2)

座長:嵯峨 幸一郎(ソニー),森 伸也(阪大)

2:30 PM - 2:45 PM

[16p-2D-6] Annealing condition dependence of Si surface flattening process

〇(D)Sohya Kudoh1, Nithi Atthi1, Shun-ichiro Ohmi1 (1.Tokyo Tech)

Keywords:surface flattening process,Silicon,devise characteristics