The 62nd JSAP Spring Meeting, 2015

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Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations ofSi related materials

[12a-A27-1~9] 13.1 Fundamental properties, surface and interface, and simulations ofSi related materials

Thu. Mar 12, 2015 10:00 AM - 12:30 PM A27 (6A-202)

11:30 AM - 11:45 AM

[12a-A27-6] Correction Method for Trapping Effects in QSSPC Life Time Measurement

〇akira nakayama1, hiromichi yoshikawa1 (1.Kyocera)

Keywords:life time,trapping,correction method