The 62nd JSAP Spring Meeting, 2015

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Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations ofSi related materials

[12a-A27-1~9] 13.1 Fundamental properties, surface and interface, and simulations ofSi related materials

Thu. Mar 12, 2015 10:00 AM - 12:30 PM A27 (6A-202)

11:45 AM - 12:00 PM

[12a-A27-7] Examination of RDF Measurements by SSRM

〇Kazuya Matsuzawa1, Shogo Itai1, Mizuki Ono1, Takamitsu Ishihara1, Li Zhang1 (1.Corp. R&D, Toshiba)

Keywords:SSRM,RDF,Schottky