9:30 AM - 11:30 AM
[12a-P12-2] Evaluation of hole trapping characteristics of MONOS structures using the constant current carrier injection method
Keywords:monos,silicon ntride,hole trapping
Poster presentation
13 Semiconductors » 13.3 Insulator technology
Thu. Mar 12, 2015 9:30 AM - 11:30 AM P12 (Gymnasium)
9:30 AM - 11:30 AM
Keywords:monos,silicon ntride,hole trapping