The 62nd JSAP Spring Meeting, 2015

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15 Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[12p-A18-1~18] 15.8 Crystal evaluation, impurities and crystal defects

Thu. Mar 12, 2015 2:00 PM - 7:00 PM A18 (6A-208)

3:45 PM - 4:00 PM

[12p-A18-7] Effect of thermal stress on critical v/G value in growing single crystal Si (II)

〇Kouji Sueoka1, Eiji Kamiyama1, Kozo Nakamura1 (1.Okayama Pref. Univ.)

Keywords:Si crystal,Intrinsic point defect,Thermal stress