The 62nd JSAP Spring Meeting, 2015

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15 Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[12p-A18-1~18] 15.8 Crystal evaluation, impurities and crystal defects

Thu. Mar 12, 2015 2:00 PM - 7:00 PM A18 (6A-208)

4:00 PM - 4:15 PM

[12p-A18-8] Properties of point defects in Si crystals determined from studies of self-diffusion and grown-in defects

〇Masashi Suezawa1, Yoshiaki Iijima1, Naoki Fukata2, Ichiro Yonenaga1 (1.Tohoku Univ., 2.NIMS)

Keywords:point defect,self-diffusion,grown-in defect