The 62nd JSAP Spring Meeting, 2015

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15 Crystal Engineering » 15.4 III-V-group nitride crystals

[12p-B1-1~23] 15.4 III-V-group nitride crystals

Thu. Mar 12, 2015 1:15 PM - 7:45 PM B1 (6B-101)

6:15 PM - 6:30 PM

[12p-B1-18] In situ X-ray diffraction measurement of GaInN single layer and GaInN/GaN superlattices on GaN

〇(B)junya ohsumi1, koji ishihara1, taiji yamamoto1, motoaki iwaya1, tetsuya takeuchi1, satoshi kamiyama1, isamu akasaki1, 2 (1.Meijo Univ., 2.ARC,Nagoya Univ.)

Keywords:GaInN,in situ XRD