The 62nd JSAP Spring Meeting, 2015

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15 Crystal Engineering » 15.4 III-V-group nitride crystals

[12p-B1-1~23] 15.4 III-V-group nitride crystals

Thu. Mar 12, 2015 1:15 PM - 7:45 PM B1 (6B-101)

6:00 PM - 6:15 PM

[12p-B1-17] Correlation between CL and impurities on pits formed on surface of InGaN films

〇Masatomo Sumiya1, 4, Naoki Toyomitsu1, 2, Jianyu Wang1, Yoshitomo Harada3, Liwen Sang1, Takashi Skiguchi1, Tomohiro Yamaguchi2, Toru Honda2 (1.NIMS, 2.Kougakuin Univ., 3.Hosei Univ., 4.JST-ALCA)

Keywords:Growth of InGaN film,impurity