The 62nd JSAP Spring Meeting, 2015

Presentation information

Print

Oral presentation

13 Semiconductors » 13.2 Exploratory Materials, Physical Properties, Devices

[14a-A25-1~11] 13.2 Exploratory Materials, Physical Properties, Devices

Sat. Mar 14, 2015 9:00 AM - 12:00 PM A25 (6A-218)

10:00 AM - 10:15 AM

[14a-A25-5] Observation of potential distribution around BaSi2 pn junction on Si(111) under applied bias by Kelvin probe force microscopy

〇Daichi Tsukahara1, Masakazu Baba1, Kaoru Toko1, Kentaro Watanabe1, 2, Takashi Sekiguchi2, Takashi Suemasu1, 3 (1.Univ. Tsukuba, 2.NIMS, 3.JST-CREST)

Keywords:KFM,BaSi2