FUMIMASA HORIKIRI

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Speaker, Author, Co-Author

Thu. Sep 15, 2016 9:00 AM - 12:30 PM B1 (Exhibition Hall)

Oral presentation
| 13 Semiconductors
| 13.8 Compound and power electron devices and process technology

[15a-B1-1~13] 13.8 Compound and power electron devices and process technology

12:00 PM - 12:15 PM

[15a-B1-12] A current stress fatigue test of GaN p-n diodes fabricated on GaN substrates

〇FUMIMASA HORIKIRI¹, HIROSHI OHTA², YOSHINOBU NARITA¹, TAKEHIRO YOSHIDA¹, TOSHIO KITAMURA¹, TOHRU NAKAMURA², TOMOYOSHI MISHIMA² (1.Sciocs Co. Ltd., 2.Hosei Univ.)

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