Mina Ryo

Speaker, Author, Co-Author

Thu. Sep 15, 2016 1:45 PM - 7:00 PM C302 (Nikko Houou)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[15p-C302-1~18] 15.6 Group IV Compound Semiconductors (SiC)

5:45 PM - 6:00 PM

[15p-C302-14] Development of in-situ observation for expansion and shrinkage of stacking faults induced in 4H-SiC PiN diode under electronic excitations.

〇Mina Ryo^1,2, Takeshi Tawara^1,2, Masaki Miyazato^1,2, Takumi Fujimoto², Kensuke Takenaka^1,2, Masaaki Miyajima^1,2, Akihiro Otsuki², Hidekazu Tsuchida³, Tomohisa Kato¹ (1.AIST, 2.Fuji Electric, 3.CRIEPI)

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