Takeshi Tawara

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Speaker, Author, Co-Author

Thu. Sep 15, 2016 1:45 PM - 7:00 PM C302 (Nikko Houou)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[15p-C302-1~18] 15.6 Group IV Compound Semiconductors (SiC)

6:00 PM - 6:15 PM

[15p-C302-15] Suppression of the forward degradation in 4H-SiC PiN diodes by employing a recombination-enhanced buffer layer

〇Takeshi Tawara^1,2, Tetsuya Miyazawa³, Mina Ryo^1,2, Masaki Miyazato^1,2, Takumi Fujimoto², Kensuke Takenaka^1,2, Shinichiro Matsunaga^1,2, Masaaki Miyajima^1,2, Akihiro Otsuki², Yoshiyuki Yonezawa¹, Tomohisa Kato¹, Hajime Okumura¹, Tsunenobu Kimoto⁴, Hidekazu Tsuchida³ (1.AIST, 2.Fuji Electric, 3.CRIEPI, 4.Kyoto Univ.)

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