Local Structural Analysis around In atoms in Al<sub>0.82</sub>In<sub>0.18</sub>N Alloy by using X-ray Absorption Fine-Structure Measurements

Ryoma Seiki; Daisuke Komori; Kazuki Ikeyama; Toshiaki Ina; Takeyoshi Onuma; Takao Miyajima; Tetsuya Takeuchi; Satoshi Kamiyama; Motoaki Iwaya; Isamu Akasaki

Presentation information

Oral presentation

15 Crystal Engineering » 15.4 III-V-group nitride crystals

[13a-A21-1~10] 15.4 III-V-group nitride crystals

Tue. Sep 13, 2016 9:00 AM - 11:45 AM A21 (Main Hall A)

Mitsuru Funato(Kyoto Univ.), Shugo Nitta(Nagoya Univ.)

11:00 AM - 11:15 AM

△ [13a-A21-8] Local Structural Analysis around In atoms in Al_0.82In_0.18N Alloy by using X-ray Absorption Fine-Structure Measurements

〇(M1)Ryoma Seiki¹, Daisuke Komori¹, Kazuki Ikeyama¹, Toshiaki Ina², Takeyoshi Onuma³, Takao Miyajima¹, Tetsuya Takeuchi¹, Satoshi Kamiyama¹, Motoaki Iwaya¹, Isamu Akasaki¹ (1.Meijo Univ., 2.JASRI, 3.Kogakuin Univ.)

Keywords:nitride semiconductor, X-ray Absorption Fine-Structure Measurements, distributed bragg reflector

Presentation information

[13a-A21-1~10] 15.4 III-V-group nitride crystals

△ [13a-A21-8] Local Structural Analysis around In atoms in Al0.82In0.18N Alloy by using X-ray Absorption Fine-Structure Measurements

△ [13a-A21-8] Local Structural Analysis around In atoms in Al_0.82In_0.18N Alloy by using X-ray Absorption Fine-Structure Measurements