The 77th JSAP Autumn Meeting, 2016

Presentation information

Oral presentation

13 Semiconductors » 13.5 Semiconductor devices and related technologies

[13p-B13-1~12] 13.5 Semiconductor devices and related technologies

Tue. Sep 13, 2016 1:45 PM - 5:00 PM B13 (Exhibition Hall)

Toshiaki Tsuchiya(Shimane Univ.), Yukinori Ono(Shizuoka Univ.)

4:00 PM - 4:15 PM

[13p-B13-9] High-accuracy operation of single-trap electron pump at 7.4 GHz

Gento Yamahata1, Stephen Giblin2, Masaya Kataoka2, Takeshi Karasawa1, Akira Fujiwara1 (1.NTT Basic Research Lab., 2.National Physical Lab.)

Keywords:single electron, standard, silicon

We performed measurements of a single-electron pump with a single-trap level by using a high-accuracy measurement system, in which a standard resistor calibrated against a primary standard was used. The pumping error rate at 7.4 GHz is about 2×10-5, which is a record value at this high frequency. This could originate from the strong confinement of the trap level. The result is an important step toward application to quantum current standards.