5:30 PM - 6:00 PM
[14p-B7-13] Low-Temperature Solid-Phase Crystallization of a-Si, a-Ge Thin Films and Defect Formation During Its Process
Keywords:Group 4 Semiconductor, Solid Phase Crystallization, Crystal Defect
The relationship between the hydrogen atoms in the Si film and the defect formation during the excimer laser annealing, that between the photon energy of the soft x-ray and the defect formation during the soft x-ray crystallization, and that between the liquid-phase crystallization or solid-phase crystallization of the FLA crystallization and the point defect are introduced.