The 77th JSAP Autumn Meeting, 2016

Presentation information

Oral presentation

15 Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[15a-A23-1~10] 15.8 Crystal evaluation, impurities and crystal defects

Thu. Sep 15, 2016 9:00 AM - 11:45 AM A23 (201B)

Kentaro Kutsukake(Tohoku Univ.), Hiroki Kawai(Toshiba)

10:30 AM - 10:45 AM

[15a-A23-6] Thermal simulation of Si wafer in ultrahigh-temperature RTP

Tatsuhiko Aoki1, Haruo Sudo1, Koji Araki1, Koji Izunome1 (1.GlobalWafers Japan)

Keywords:RTP, Thermal Simulation