The 77th JSAP Autumn Meeting, 2016

Presentation information

Print

Oral presentation

15 Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[15p-A23-1~20] 15.8 Crystal evaluation, impurities and crystal defects

Thu. Sep 15, 2016 1:15 PM - 6:45 PM A23 (201B)

Takahiro Maeta(Global Wafers Japan), Takuto Kojima(Meiji Univ.), Yutaka Ohno(Tohoku Univ.)

3:30 PM - 3:45 PM

[15p-A23-9] Bulk lifetime of free carriers evaluated by parallel dual laser-beam technique: Detection of lifetime degradation due to intentional Fe contamination

〇Hiroshi Kaneta1, Ichiro Omura1 (1.Kyushu Inst. Tech.)

Keywords:silicon, carrier lifetime, laser