The 77th JSAP Autumn Meeting, 2016

Presentation information

Poster presentation

6 Thin Films and Surfaces » 6.2 Carbon-based thin films

[15p-P2-1~15] 6.2 Carbon-based thin films

Thu. Sep 15, 2016 1:30 PM - 3:30 PM P2 (Exhibition Hall)

1:30 PM - 3:30 PM

[15p-P2-11] EBIC current analysis on diamond Schottky barrier diode under reverse bias conditions

Hitoshi Umezawa1,2,3, Khaled Driche2,3,4, Hiroki Gima5, Yukako Kato1, Tsuyoshi Yoshitake5, Etienne Gheeraert2,3,4, Yoshiaki Mokuno1 (1.AIST, 2.Inst Neel, 3.Univ. Grenoble Alpes, 4.Tsukuba Univ., 5.Kyushu Univ.)

Keywords:diamond, EBIC, impact ionization coefficient