Yoshitaro Sakata

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Speaker, Author, Co-Author

Sat. Mar 19, 2016 1:45 PM - 5:30 PM S322 (S3)

Oral presentation
| 1 Interdisciplinary Physics and Related Areas of Science and Technology
| 1.5 Instrumentation, measurement and Metrology

[19p-S322-1~14] 1.5 Instrumentation, measurement and Metrology

3:30 PM - 3:45 PM

△ [19p-S322-8] Non-contact latent flaws detection technique -Detection of latent flaws under the surface of a glass substrate by thermal stress-induced light scattering method-

〇Yoshitaro Sakata¹, Nao Terasaki¹, Kazuhiro Nonaka¹ (1.AIST)