Riichiro Takaishi

→ Search for Riichiro Takaishi in Google Scholar

Speaker, Author, Co-Author

Sun. Mar 20, 2016 1:45 PM - 6:15 PM S221 (S2)

Oral presentation
| 13 Semiconductors
| 13.3 Insulator technology

[20p-S221-1~17] 13.3 Insulator technology

4:45 PM - 5:00 PM

△ [20p-S221-12] Analysis of temperature-dependent structure change of ferroelectric Hf(Y)O thin films by synchrotron radiation X-ray diffraction

〇Riichiro Takaishi¹, Tsunehiro Ino¹, Shosuke Fujii¹ (1.Toshiba Corp.)