6:30 PM - 6:45 PM [21p-H111-22] Evaluation of Resistive Switching Properties of Si-rich Oxide Embedded with Ti Based Thin Films and Ti Nano-dots 〇Yusuke Kato1, Akio Ohta1, Katsunori Makihara1, Seiichi Miyazaki1 (1.Nagoya Univ.)