6:30 PM - 6:45 PM
[21p-H111-22] Evaluation of Resistive Switching Properties of Si-rich Oxide Embedded with Ti Based Thin Films and Ti Nano-dots
Keywords:ReRAMs,Ti-Nanodots,Si-rich oxide
Oral presentation
6 Thin Films and Surfaces » 6.3 Oxide electronics
Mon. Mar 21, 2016 1:00 PM - 6:45 PM H111 (H)
Hisashi Shima(AIST), Yasuhisa Naitoh(AIST)
6:30 PM - 6:45 PM
Keywords:ReRAMs,Ti-Nanodots,Si-rich oxide