The 63rd JSAP Spring Meeting, 2016

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Symposium » Blazing frontier of luminescence imaging for characterization of semiconductor crystals and devices

[19p-S011-1~11] Blazing frontier of luminescence imaging for characterization of semiconductor crystals and devices

Sat. Mar 19, 2016 1:30 PM - 5:45 PM S011 (S0)

Yasuaki Ishikawa(NAIST), Ryuji Katayama(Tohoku Univ.), Hiroshi Yano(Univ. of Tsukuba)

4:15 PM - 4:45 PM

[19p-S011-8] Spatio-Time-Resolved Cathodoluminescence Studies of Ⅲ-Nitride Semiconductors

〇Shigefusa Chichibu1, Yoshiki Yamazaki1, Kazunobu Kojima1 (1.IMRAM, Tohoku Univ.)

Keywords:GaN,Spatio-time-resolved spectoscopy

The results of spatio-time-resolved cathodoluminescence (STRCL) measurements of GaN will be shown.