The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[19p-S223-1~10] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

Sat. Mar 19, 2016 3:30 PM - 6:00 PM S223 (S2)

Tomo Ueno(TUAT), Koichiro Saga(Sony)

5:45 PM - 6:00 PM

[19p-S223-10] Particle removal efficiency evaluation of filters in 70 ℃ diluted hydrochloric acid

Tomoyuki Takakura1, Shuichi Tsuzuki1 (1.Nihon Pall Ltd.)

Keywords:filter,semiconductor,filtration

As a part of filter performance evaluation in the chemicals used for semiconductor device cleaning processes, we investigated filters’ particle removal efficiency in 70 deg. C pH1 HCl. The test filters were 10 inch cartridge filters made of 10-nm-rating surface-modified PTFE and Highly Asymmetric Polyarylsulfone (HAPAS) membranes. The results showed that the filters effectively removed particles in the chemical.