The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

[20a-H111-1~10] 6.3 Oxide electronics

Sun. Mar 20, 2016 9:15 AM - 11:45 AM H111 (H)

Enju Sakai(Univ. of Tokyo)

10:00 AM - 10:15 AM

[20a-H111-4] Evaluation of Stored Charge in HfO2/SiO2/Si structure

〇(M1)Kazuma Noguchi1, Hiromori Yutaro1, Miyatake Shinji1, Nara Yasuo1 (1.Univ. of Hyogo)

Keywords:electret,hafnium,fixed charge