[20a-H113-1~12] 15.8 Crystal evaluation, impurities and crystal defects

[20a-H113-11] Bulk lifetime of free carriers evaluated by parallel dual laser-beam technique: Theory of infrared laser beam refraction by free carriers

〇Hiroshi Kaneta¹, Ichiro Omura¹ (1.Kyushu Inst. Tech.)

Keywords:silicon,carrier lifetime,power device