The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

15 Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[20a-H113-1~12] 15.8 Crystal evaluation, impurities and crystal defects

Sun. Mar 20, 2016 9:30 AM - 12:45 PM H113 (H)

Kentaro Kutsukake(Tohoku Univ.), Yuta Nagai(GlobalWafers Japan)

9:45 AM - 10:00 AM

[20a-H113-2] Comments on the Voronkov model: Stages 1 & 2

Masashi Suezawa1, Yoshiaki Iijima1, Ichiro Yonenaga1 (1.I.M.R., Tohoku Univ.)

Keywords:Voronkov model,Frenkel pair,Schottky defect

The Voronkov model on grown-in defects in silicon crystal is developed based on the assumption that the thermal equilibrium point defects are the Frenkel pairs. As shown in the previous presentation, they are not Frenkel pairs but Schottky defects. We modify the stages 1 & 2 of the Voronkov model based on the Schottky defects.