The 63rd JSAP Spring Meeting, 2016

Presentation information

Poster presentation

13 Semiconductors » 13.2 Exploratory Materials, Physical Properties, Devices

[20p-P13-1~14] 13.2 Exploratory Materials, Physical Properties, Devices

Sun. Mar 20, 2016 4:00 PM - 6:00 PM P13 (Gymnasium)

4:00 PM - 6:00 PM

[20p-P13-12] Electrical properties of nitrogen-doped FeSi2 films prepared by sputtering

Ryuji Baba1, Hirokazu Kishimoto1, 〇Tsuyoshi Yoshitake1 (1.Kyushu Univ.)

Keywords:iron disilicide,nitrogen incorporation,nanocrystalline

Effects of nitrogen incorporation on electrical and optical properties of nanocrystalline FeSi2 films prepared by sputtering were investigated.