The 63rd JSAP Spring Meeting, 2016

Presentation information

Poster presentation

13 Semiconductors » 13.2 Exploratory Materials, Physical Properties, Devices

[20p-P13-1~14] 13.2 Exploratory Materials, Physical Properties, Devices

Sun. Mar 20, 2016 4:00 PM - 6:00 PM P13 (Gymnasium)

4:00 PM - 6:00 PM

[20p-P13-7] Ion channeling study of β-FeSi2 /Si hetero-epitaxial structures

Yoshihito Maeda1, Yosikazu Terai1, Kazumasa Narumi2 (1.Kyushu Ist. Tech., 2.JAEA)

Keywords:beta-FeSi2,ion channeling,hetero-epitaxial growth

Epitaxy of β-FeSi2/Si(111) hetero-stuctures has been investigated by ion channeling. Axial ion channeling along Si<111> directions was observed and the average atomic displacement deduced from the minimum yield at the interface was very large. It is because atomic arrangement in β-FeSi2 is different from that in Si, tilt of crystal axes may take place, or in-plain mosaic structures may form.