The 63rd JSAP Spring Meeting, 2016

Presentation information

Poster presentation

13 Semiconductors » 13.10 Compound solar cells

[20p-P14-1~23] 13.10 Compound solar cells

Sun. Mar 20, 2016 4:00 PM - 6:00 PM P14 (Gymnasium)

4:00 PM - 6:00 PM

[20p-P14-5] Quantification of sputtering damage during deposition on a substrate using electrochemical impedance spectroscopy for thin film solar cells

〇(M1)Hiroshi Nakai1, Hidenori Sakakura1, Daisuke Kawade1, Huseyin Sari2, Masayuki Itagaki1, Mutsumi Sugiyama1 (1.Faculty of Science & Technology / RIST, Tokyo University of Science, 2.Ankara University)

Keywords:sputter,NiO,electrochemical impedance spectroscopy