The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

13 Semiconductors » 13.5 Semiconductor devices and related technologies

[20p-S422-1~18] 13.5 Semiconductor devices and related technologies

Sun. Mar 20, 2016 1:45 PM - 6:30 PM S422 (S4)

Keiji Ikeda(TOSHIBA), Jiro Ida(Kanazawa Inst. of Tech.)

1:45 PM - 2:00 PM

[20p-S422-1] Improving electrical characteristics of sputtered MoS2 film by post-annealing in forming gas atmosphere

Junichi Shimizu1, Takumi Ohashi1, Kentaro Matsuura1, Kuniyuki Kakushima1, Kazuo Tsutsui1, Hitoshi Wakabayashi1 (1.Tokyo Tech)

Keywords:MoS2,2D material,Sputtering