The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

13 Semiconductors » 13.2 Exploratory Materials, Physical Properties, Devices

[21a-S223-1~13] 13.2 Exploratory Materials, Physical Properties, Devices

Mon. Mar 21, 2016 9:00 AM - 12:30 PM S223 (S2)

Takashi Suemasu(Univ. of Tsukuba), Yoshikazu Terai(Kyushu Inst. of Tech.)

12:15 PM - 12:30 PM

[21a-S223-13] Investigation on ac Pseudo-MOSFET technique for SOI substrates

Isao Yarita1, Singo Sato1, Yasuhisa Omura1 (1.kansai Univ.)

Keywords:pseudo-MOS,SOI substrate,ac signal analysis

It is always well known that the pseudo-MOS tecnique is applicable to the evaluation of the SOI substrate. However, the dc technique was only applied to the evaluation. In this paper, we challenged how the ac technique is powerful to extract some physical parameters of SOI substrates.
By assuming the equivalent circuit, we successfully extracted some parameters of the substrate.