The 63rd JSAP Spring Meeting, 2016

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6 Thin Films and Surfaces » 6.3 Oxide electronics

[21p-H111-1~22] 6.3 Oxide electronics

Mon. Mar 21, 2016 1:00 PM - 6:45 PM H111 (H)

Hisashi Shima(AIST), Yasuhisa Naitoh(AIST)

6:30 PM - 6:45 PM

[21p-H111-22] Evaluation of Resistive Switching Properties of Si-rich Oxide Embedded with Ti Based Thin Films and Ti Nano-dots

〇Yusuke Kato1, Akio Ohta1, Katsunori Makihara1, Seiichi Miyazaki1 (1.Nagoya Univ.)

Keywords:ReRAMs,Ti-Nanodots,Si-rich oxide