The 63rd JSAP Spring Meeting, 2016

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7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[21p-H137-1~22] 7.2 Applications and technologies of electron beams

Mon. Mar 21, 2016 1:15 PM - 7:00 PM H137 (H)

Yoichiro Neo(Shizuoka Univ.), Hitoshi Nakahara(Nagoya Univ.), Yasuhito Gotoh(Kyoto Univ.)

3:00 PM - 3:15 PM

[21p-H137-8] Ptychographcal phase retrieval with real space image constrains

〇Kazutaka Mitsuishi1, Masayuki Shimojo2, Masaki Takeguchi1 (1.NIMS, 2.Shibaura Inst. Tech.)

Keywords:electron microscopy,Ptychography,phase retrieval

Ptychographcal iterative phase retrieval is a technique that can retrieve the phase form set of diffraction patterns obtained by different experimental conditions. For application of this technique using electron microscope, real-space image is usually available. Therefore, in this research, possibility of using real-space image as an additional constraints for ptychographical phase retrieval is studied.