The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[21p-H137-1~22] 7.2 Applications and technologies of electron beams

Mon. Mar 21, 2016 1:15 PM - 7:00 PM H137 (H)

Yoichiro Neo(Shizuoka Univ.), Hitoshi Nakahara(Nagoya Univ.), Yasuhito Gotoh(Kyoto Univ.)

3:15 PM - 3:30 PM

[21p-H137-9] Development of electrostatic Cs-corrector using annular and circular electrodes (ACE corrector)(3)

Tadahiro Kawasaki1,2, Yasuyuki Takai3, Yuki Ogawa3, Takafumi Ishida2, Tetsuji Kodama3, Masahiro Tomita4, Takaomi Matsutani5, Takashi Ikuta6 (1.JFCC, 2.IMaSS, Nagoya Univ., 3.Meijo Univ., 4.Vacuum Device Inc., 5.Kinki Univ., 6.OECU)

Keywords:Cs corrector,Electron microscope,Chromatic aberration

The spherical-aberration-corrector for high-resolution electron microscopes has been newly designed and constructed. This aberration correction device is formed by an electrostatic lens consisted of only two electrodes having annular and circular holes and a constant-voltage supply. We call it “ACE (Annular and Circular Electrodes) corrector”. The ACE corrector has big advantages in easy alignment and very low-cost over the conventional Cs-correctors. In this study, we have investigated behaviors of the spherical and chromatic aberrations in the proposed device by numerical calculations.