The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

13 Semiconductors » 13.8 Compound and power electron devices and process technology

[22p-W541-1~8] 13.8 Compound and power electron devices and process technology

Tue. Mar 22, 2016 1:00 PM - 3:00 PM W541 (W5)

Naoteru Shigekawa(Osaka City Univ.)

1:30 PM - 1:45 PM

[22p-W541-3] Noise Performance of InGaAs/InAlAs HEMT in a 50 GHz band

Issei Watanabe1, Akira Endoh1,2, Takashi Mimura1,2, Akifumi Kasamatsu1 (1.NICT, 2.Fujitsu Lab. Ltd.)

Keywords:InGaAs,HEMT,Noise performance

We achieved a low minimum noise figure (NFmin) of 0.6 dB and an associated gain of 4.7 dB at 50 GHz for a 35-nm-gate In0.7Ga0.3As/In0.52Al0.48As HEMT when biased at a drain-source voltage of 0.4 V and a gate-source voltage of -0.2 V. This NFmin is one of the lowest values for InGaAs/InAlAs HEMTs ever reported in the 50 GHz band.