〇Mayuko Okada¹, Yuta Miyachi¹, Makoto Miyoshi¹, Takashi Egawa¹ (1.Nagoya Institute of Technology)

〇Yoshimi Yamashita¹, Issei Watanabe¹, Akira Endho^1,2, Akifumi Kasamatsu¹, Takashi Mimura^1,2 (1.NICT, 2.Fujitsu Lab.)

〇Katsunori Ueno¹, Shinya Takashima¹, Takuro Inamoto¹, Hideaki Matsuyama¹, Masaharu Edo¹, Kiyokazu Nakagawa² (1.Fuji Electric, 2.Univ. of Yamanashi)

〇(M1)atsushi seino¹, Taito Hasezaki¹, Naoshige Yokota¹, Masamichi Akazawa¹ (1.RCIQE Hokkaido Univ.)

〇(D)Md Sahab Uddin¹, Kazuyoshi Ueno^1,2 (1.Shibaura Inst. Tech., 2.SIT RCGI)

〇Yuya Urayama¹, Arata Watanabe¹, Takashi Egawa¹ (1.NIT)

〇Fumihiko Nakamura¹, Shoko Hirata¹, Hiroshi Sugiura¹, Hiroji Kawai¹ (1.POWDEC K.K.)

〇(M1)Shougo Ueda¹, Masahiro Goto¹, Kota Takabayashi¹, Yutaka Tokuda¹, Kenji Shiojima², Jyoji Ito³, Takahide Yagi³ (1.Aichi Inst. of Tecnol., 2.Fukui University, 3.S. H. I. Examination & Inspection, Ltd.)

Yusuke Koga¹, Ryohei Inoue¹, 〇Seiji Nakamura¹, Tsugunori Okumura¹ (1.Tokyo Metropolitan Univ.)

〇Yoshitaka Nakano¹, Yusuke Sakai¹, Masahito Niibe², Retsuo Kawakami³ (1.Chubu Univ., 2.Univ. Hyogo, 3.Tokushima Univ.)

〇Xiaoyi Zhang¹, Keisuke Ito¹, Hirofumi Kida¹, Yusuke Kumazaki¹, Taketomo Sato¹ (1.RCIQE,Hokkaido Univ.)

〇Masaaki Edamoto¹, Yusuke Kumazaki¹, Taketomo Sato¹ (1.Hokkaido Univ. RCIQE)

〇Kotaro Sato¹, Daisuke Ando¹, Yuji Suto¹, Junichi Koike¹ (1.Tohoku Univ.)

〇takato sato¹, Yui Nishio¹, Naomi Hirayama¹, Tsutomu Iida¹, Yoshifumi Takanashi¹ (1.Tokyo Univ. of Science)

〇(M2)kato Sanshiro¹, Airi Miyashita, Sachie Fujikawa, Hiroki Fujishiro (1.Tokyo University of Science)

〇TOMOTAKA HOSOTANI¹, Taiichi Otsuji¹, Tetsuya Suemitsu¹ (1.RIEC, Tohoku Univ.)

〇Takuya Hoshi¹, Norihide Kashio², Yuta Shiratori¹, Hiroki Sugiyama¹, Kenji Kurishima¹, Minoru Ida¹, Hideaki Matsuzaki¹ (1.NTT Device Technology Labs, 2.NTT Device Innovation Center)

〇Toshiyuki Oishi¹, Makoto Kasu¹ (1.Saga Univ.)

〇Toshiyuki Oishi¹, Naoto Kawano¹, Makoto Kasu¹ (1.Saga Univ.)

〇(B)Naoto Kawano¹, Oishi Toshiyuki¹, Kasu Makoto¹ (1.Saga Univ.)

〇Kohji Inagaki¹, Pho Van Bui¹, Ai Isohashi¹, Daisetsu Toh¹, Yoshitada Morikawa¹, Kazuto Yamauchi¹ (1.Osaka Univ.)

〇Yukie Ishizawa¹, Kenji Inaba¹, Yukiko Obara¹, Emi Sato¹, Manami Sato¹, Masayuki Miyano¹, Patrick Bonnaud¹, Ryuji Miura¹, Ai Suzuki¹, Naoto Miyamoto¹, Nozomu Hatakeyama¹, Akira Miyamoto¹ (1.Tohoku Univ.)

〇Kentarou Hayashi¹, Hiroshi Ohta¹, Naoki Kaneda², Fumimasa Horikiri³, Yoshinobu Narita³, Takehiro Yoshida³, Tomoyoshi Mishima¹, Tohru Nakamura¹ (1.Hosei Univ., 2.Quantum Spread, 3.Sciocs)

〇Moe Naganawa¹, Toshichika Aoki¹, Tomoyoshi Mishima², Kenji Shiojima¹ (1.Univ. of Fukui, 2.Hosei Univ.)

〇Kenji Shiojima¹, Toshichika Aoki¹, Tokuyuki Teraji², Yasuo Koide² (1.Univ. of Fukui, 2.NIMS)

〇Masato Shingo¹, Takafumi Ito¹, Yukiyasu Kashiwagi², Tasuku Shigemune³, Atsushi Koizumi³, Takanori Kojima³, Masashi Saitoh², Kimihiro Matsukawa², Yasufumi Fujiwara³, Kenji Shiojima¹ (1.Univ. of Fukui, 2.Osaka Munic. Tech. Res. Inst., 3.Osaka Univ.)

〇Hiroyoshi Imadate¹, Akihisa Terano¹, Kenji Shiojima¹ (1.Univ. of Fukui)

Rikito Orimo¹, Kenta Onishi¹, 〇Seiji Nakamura¹, Tsugunori Okumura¹ (1.Tokyo Metropolitan Univ.)

〇Jun Suda¹, Masahiro Horita¹, Takuya Maeda², Naoki Sawada¹, Tsunenobu Kimoto¹ (1.Kyoto Univ., 2.Faculty of Eng., Kyoto Univ.)

〇Masahiro Horita¹, Tetsuo Narita², Tetsu Kachi², Tsutomu Uesugi², Jun Suda¹ (1.Kyoto Univ., 2.Toyota Central R&D Labs.)

〇Kenji Shiojima¹, Takeshi Tanaka^1,2, Tomoyoshi Mishima³, Yutaka Tokuda⁴ (1.Univ. of Fukui, 2.SCIOCS Ltd., 3.Hosei Univ., 4.Aichi Inst. Tech.)

〇(M1)Shougo Ueda¹, Kazuki Miyamoto¹, Yutaka Tokuda¹ (1.Aichi Inst. of Tecnol.)

〇Suguru Mase¹, Yuya Urayama¹, Takashi Egawa¹ (1.NIT)

〇(B)Takuya Maeda¹, Masaya Okada², Masaki Ueno², Yoshiyuki Yamamoto², Masahiro Horita³, Jun Suda³ (1.Kyoto Univ., 2.Sumitomo Electric Industries,Ltd., 3.Dept. of Electron. Sci&Eng.,Kyoto Univ.)

〇(M1)Satoshi Yoshida¹, Shintaro Ohi¹, Taisei Yamazaki¹, Joel Asubar¹, Hirokuni Tokuda¹, Masaaki Kuzuhara¹ (1.University of Fukui)

〇Mikito Nozaki¹, Ryohei Asahara¹, Joyo Ito¹, Kenta Watanabe¹, Takahiro Yamada¹, Satoshi Nakazawa², Yoshiharu Anda², Masahiro Ishida², Tetsuzo Ueda², Takuji Hosoi¹, Takayoshi Shimura¹, Heiji Watanabe¹ (1.Osaka Univ., 2.Panasonic)

〇(B)Kenta Watanabe¹, Ryohei Asahara¹, Joyo Ito¹, Mikito Nozaki¹, Takahiro Yamada¹, Satoshi Nakazawa², Yoshiharu Anda², Masahiro Ishida², Tetsuzo Ueda², Takuji Hosoi¹, Takayoshi Shimura¹, Heiji Watanabe¹ (1.Osaka Univ., 2.Panasonic)

〇Shunsuke Kubota¹, Akira Nakajima², Shin-ichi Nishizawa², Hiromichi Ohashi¹, Kuniyuki Kakushima¹, Hitoshi Wakabayashi¹, Kazuo Tsutsui¹ (1.Tokyo Tech. IGSSE, 2.AIST)

〇(M1)Aki Sasakura¹, Hirokuni Tokuda¹, Masaharu Edo², Katsunori Ueno², Masaaki Kuzuhara¹ (1.University of Fukui, 2.Fuji Electric)

〇yuya yamaoka^1,2, Kazuhiro Ito², Ubukata Akinori¹, Yoshiki Yano¹, Toshiya Tabuchi¹, Koh Matsumoto¹, Takashi Egawa² (1.TNSC, 2.NItech)

〇naoki kato¹, nagai takaya¹, narita tomotaka¹, osada yamato², kamimura ryuichiro², ito kenji³, wakejima akio¹, egawa takashi¹ (1.Nagoya Inst. of Tech, 2.ULVAC, 3.Kanazawa Inst. of Tech)

〇Kota Sugamata¹, Naoki Kaneda², Tomoyoshi Mishima¹, Tohru Nakamura¹ (1.Hosei Univ., 2.Quantum Spread)

〇Masanobu Hiroki¹, Kazuhide Kumakura¹, Hideki Yamamoto¹ (1.NTT BRL)

〇Shuichi Yagi¹, Shouko Hirata¹, Yusuke Kamiyama¹, Fumihiko Nakamura¹, Takeru Saito¹, Hiroji Kawai¹ (1.POWDEC)

〇Michitaka Yoshino¹, Fumimasa Horikiri², Hiroshi Ohta¹, Yasuhiro Yamamoto¹, Tomoyoshi Mishima¹, Tohru Nakamura¹ (1.Hosei Univ., 2.sciocs)

〇(M1)shoji yamajo¹, Sanji Yoon¹, Jianbo Liang¹, Noriyuki Watanabe², Naoteru Shigekawa¹ (1.Osaka City Univ., 2.NTT Device Technology Labs.)

〇Toshiharu Kubo¹, Gosuke Nishino¹, Takashi Egawa¹ (1.Nagoya Inst. Tech.)

〇Yusuke Takei¹, Tomohiro Shimoda¹, Masayasu Takahashi¹, Kazuo Tsutsui¹, Wataru Saito², Kuniyuki Kakushima¹, Hitoshi Wakabayashi¹, Hiroshi Iwai¹ (1.Tokyo Inst. Technol., 2.Toshiba)

〇Yuta Ikeuchi¹, Hitoshi Wakabayashi¹, Kazuo Tsutsui¹, Hiroshi Iwai¹, Kuniyuki Kakushima¹ (1.Tokyo Tech.IGSSE)

〇Takahiro Yamada¹, Joyo Ito¹, Ryohei Asahara¹, Kenta Watanabe¹, Mikito Nozaki¹, Satoshi Nakazawa², Yoshiharu Anda², Masahiro Ishida², Tetsuzo Ueda², Akitaka Yoshigoe³, Takuji Hosoi¹, Takayoshi Shimura¹, Heiji Watanabe¹ (1.Osaka Univ., 2.Panasonic, 3.JAEA)

〇Takahiro Yamada¹, Joyo Ito¹, Ryohei Asahara¹, Kenta Watanabe¹, Mikito Nozaki¹, Takuji Hosoi¹, Takayoshi Shimura¹, Heiji Watanabe¹ (1.Osaka Univ.)

〇Kenya Nishiguchi¹, Tamotsu Hashizume¹ (1.RCIQE)

〇Shinya Yamaguchi¹, Toshimasa Ui¹, Takahiro Hasegawa¹ (1.JAIST)

〇Yuta Tominaga¹, Ueno Katsunori², Koji Yoshitsugu¹, Tada Yuki¹, Yasuaki Ishikawa¹, Yukiharu Uraoka¹ (1.NAIST, 2.Fuji Electric)

〇Fuyumi Hemmi¹, Cedric Thomas², Yi-Chun Lai³, Akio Higo³, Alex Guo⁴, Shireen Warnock⁴, Jesus A. del Alamo⁴, Seiji Samukawa^2,3, Taiichi Otsuji¹, Tetsuya Suemitsu¹ (1.RIEC Tohoku Univ., 2.IFS Tohoku Univ., 3.AIMR Tohoku Univ., 4.MTL MIT)

〇Yuya Uzumaki¹, Yoko Ono¹, Shigeo Ogawa¹, Yoshitaka Taniyasu², Kazuhide Kumakura², Takeshi Komatsu¹ (1.NTT Sende Lab., 2.NTT Bussei Lab.)

〇yuki yamada¹, miyuki uomoto², takehito shimatsu², masahiro nada¹, hideaki matsuzaki¹ (1.NTT Device Tech. Labs., 2.Tohoku Univ.)

〇(M2)Daisuke Tsuji¹, Kyousuke Isono¹, Tatsuya Taketsuru¹, Sachie Fujikawa¹, Issei Watanabe², Yoshimi Yamashita², Akira Endoh², Shinsuke Hara², Akifumi Kasamatsu², Hiroki Fujishiro¹ (1.Tokyo Univ. of Science, 2.National Institute of Info. & Com. Tech.)

〇Issei Watanabe¹, Akira Endoh^1,2, Takashi Mimura^1,2, Akifumi Kasamatsu¹ (1.NICT, 2.Fujitsu Lab. Ltd.)

〇Yuta Shiratori¹, Takuya Hoshi¹, Norihide Kashio², Kenji Kurishima¹, Eiji Higurashi³, Hideaki Matsuzaki¹ (1.NTT Device Technology Labs., 2.NTT Device Innovation Center, 3.Univ. of Tokyo)

〇haruki kinoshita¹, nobukazu kise¹, seiko netsu¹, toru kanazawa¹, yasuyuki miyamoto¹ (1.Tokyo Tech)

〇Makoto Kasu¹, Kazuya Harada¹, Yuta Koga¹, Kenji Hanada¹, Toshiyuki Oishi¹ (1.Saga Univ.)

〇Keita Konishi¹, Takafumi Kamimura¹, Man Hoi Wong¹, Kohei Sasaki^2,1, Akito Kuramata², Shigenobu Yamakoshi², Masataka Higashiwaki¹ (1.NICT, 2.Tamura Corp.)

〇ManHoi Wong¹, Kohei Sasaki^2,1, Akito Kuramata², Shigenobu Yamakoshi², Masataka Higashiwaki¹ (1.NICT, 2.Tamura Corp.)