Yuji Kiuchi

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Speaker, Author, Co-Author

Tue. Sep 5, 2017 9:00 AM - 11:45 AM A203 (203)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[5a-A203-1~10] 15.6 Group IV Compound Semiconductors (SiC)

11:30 AM - 11:45 AM

[5a-A203-10] Impact of measurement methods on threshold voltage shift under long term gate bias stress

〇Yuji Kiuchi^1,2, Mitsuru Sometani¹, Dai Okamoto³, Tetsuo Hatakeyama¹, Mitsuo Okamoto¹, Shinsuke Harada¹, Hiroshi Yano³, Yoshiyuki Yonezawa¹, Hajime Okumura¹ (1.AIST, 2.NJR, 3.Univ. Tsukuba)

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