Nobuhiko SATO

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Speaker, Author, Co-Author

Tue. Sep 5, 2017 1:30 PM - 5:45 PM A204 (204)

Symposium (Oral)
| Symposium
| Science of impurity control in silicon wafers

[5p-A204-1~9] Science of impurity control in silicon wafers

5:15 PM - 5:45 PM

[5p-A204-9] Influence of metal impurities and others on performance of CMOS image sensors

〇Nobuhiko SATO¹ (1.Canon Inc.)