Takayuki Hisaka

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Speaker, Author, Co-Author

Wed. Sep 6, 2017 4:00 PM - 6:00 PM PA8 (P)

Poster presentation
| 13 Semiconductors
| 13.8 Compound and power electron devices and process technology

[6p-PA8-1~31] 13.8 Compound and power electron devices and process technology

4:00 PM - 6:00 PM

[6p-PA8-14] Proton irradiation effect on long-term reliability of GaN HEMTs

〇Takayuki Hisaka¹, Hajime Sasaki¹, Tomoki Oku¹, Satoshi Hatori², Ryoya Ishigami², Kyo Kume² (1.Mitsubishi Electric Corp., 2.Wakasa Wan Energy Reserch Center)

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