Shinichiro Abe

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Speaker, Author, Co-Author

Thu. Sep 7, 2017 9:30 AM - 11:30 AM PB3 (P)

Poster presentation
| 13 Semiconductors
| 13.5 Semiconductor devices and related technologies

[7a-PB3-1~9] 13.5 Semiconductor devices and related technologies

9:30 AM - 11:30 AM

[7a-PB3-8] Analysis of soft errors for FinFET technology based on the multiple sensitive volume model using PHITS code

〇Shinichiro Abe¹, Tatsuhiko Sato¹, Takashi Kato², Hideya Matsuyama² (1.JAEA, 2.Socionext Inc.)