Yuuki Uchida

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Speaker, Author, Co-Author

Thu. Sep 7, 2017 1:30 PM - 3:30 PM PB6 (P)

Poster presentation
| 15 Crystal Engineering
| 15.7 Crystal evaluation, impurities and crystal defects

[7p-PB6-1~10] 15.7 Crystal evaluation, impurities and crystal defects

1:30 PM - 3:30 PM

△ [7p-PB6-8] Evaluation of SiC-MOSFET by multifunctional scanning probe microscope

〇(M1C)Yuuki Uchida¹, Mizuki Nakajima¹, Hidekazu Yamamoto¹, Nobuo Satoh¹ (1.CIT)