Symposium (Oral)
Symposium » Recent GFIS /advanced ion source microscopy technologies and its future prospects for R & D of materials and devices
Thu. Sep 7, 2017 1:45 PM - 6:00 PM C13 (office 2-2)
Reo Kometani(Univ. of Tokyo), Hiroshi Mizuta(JAIST), Shinichi Ogawa(AIST)
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1:45 PM - 2:00 PM
〇Shinichi Ogawa1 (1.AIST)
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2:00 PM - 2:15 PM
〇(PC)Marek Edward Schmidt1, Shinichi Ogawa2, Hiroshi Mizuta1 (1.JAIST, 2.AIST)
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2:15 PM - 2:45 PM
〇William Bond Thompson1 (1.Heelionics LLC)
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2:45 PM - 3:15 PM
〇Hiroshi Mizuta1, Marek Schmidt1, Mayeesha Haque1, Shinichi Ogawa2, Manoharan Muruganathan1 (1.JAIST, 2.AIST)
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3:15 PM - 3:45 PM
〇Kentaro Kawai1, Takumi Hayashi1, Kenta Arima1, Osamu Tabata2 (1.Osaka University, 2.Kyoto Univesity)
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4:00 PM - 4:30 PM
〇Gregor Hlawacek1 (1.HZDR)
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4:30 PM - 5:00 PM
〇Shinichi Matsubara1, Hiroyasu Shichi1, Tomihiro Hashizume1 (1.Hitachi, Ltd., Research & Development Group)
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5:00 PM - 5:30 PM
〇Reo Kometani1 (1.Univ. of Tokyo)
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5:30 PM - 6:00 PM
〇Takahiro Namazu1 (1.Aichi Institute of Technology)
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